基本信息:
- 专利标题： 用于测量二维图像相似性的方法和电子显微镜
- 专利标题（英）：Method and electron microscope for measuring the similarity of two-dimensional images
- 申请号：CN200780030442.9 申请日：2007-07-25
- 公开(公告)号：CN101506839B 公开(公告)日：2012-10-31
- 发明人： A·瑟斯特 , J·巴塞尔
- 申请人： 于利奇研究中心有限公司
- 申请人地址： 德国于利奇
- 专利权人： 于利奇研究中心有限公司
- 当前专利权人： 于利奇研究中心有限公司
- 当前专利权人地址： 德国于利奇
- 代理机构： 中国专利代理(香港)有限公司
- 代理人： 柯广华; 刘春元
- 优先权： 102006038211.0 2006.08.16 DE
- 国际申请： PCT/DE2007/001314 2007.07.25
- 国际公布： WO2008/019644 DE 2008.02.21
- 进入国家日期： 2009-02-16
- 主分类号： G06T5/00
- IPC分类号： G06T5/00 ; H01J37/26
The invention relates to a method for measuring the similarity of two-dimensional images, where at least one image contains an additional signal whose position dependency or symmetry characteristics are known at least in the form of an estimate. The invention involves the images being partitioned into reciprocally identical subimages such that the extent of at least one subimage in the direction of the gradient of the additional signal is less than the extent of this subimage in the direction perpendicular thereto. The subimages are compared separately and the results of all the comparisons are combined to form the measurement result for the similarity. This makes the method insensitive towards variations in the additional signal. The method is particularly suitable for determining defocusing and astigmatism in an electron-microscope image. This is dependent upon comparison of the similarity of an experimentally measured image with simulated images which have been generated with particular values for defocusing and astigmatism.
公开/授权文献:
- CN101506839A 用于测量二维图像相似性的方法和电子显微镜 公开/授权日：2009-08-12
IPC结构图谱:
| G | 物理 |
| --G06 | 计算；推算；计数 |
| ----G06T | 一般的图像数据处理或产生 |
| ------G06T5/00 | 图像的增强或复原，如从位像到位像地建立一个类似的图形 |