![用于测试电子基底上的沉淀物的拉伸测试装置和方法](/CN/2007/8/5/images/200780025070.jpg)
基本信息:
- 专利标题: 用于测试电子基底上的沉淀物的拉伸测试装置和方法
- 专利标题(英):Tensile test device and method for testing deposits on electronic substrates
- 申请号:CN200780025070.0 申请日:2007-07-03
- 公开(公告)号:CN101484788B 公开(公告)日:2012-10-10
- 发明人: 罗伯特·约翰·赛科斯
- 申请人: 达格精度工业有限公司
- 申请人地址: 英国白金汉郡
- 专利权人: 达格精度工业有限公司
- 当前专利权人: 达格精度工业有限公司
- 当前专利权人地址: 英国白金汉郡
- 代理机构: 中原信达知识产权代理有限责任公司
- 代理人: 张建涛; 车文
- 优先权: 0613205.4 20060703 GB
- 国际申请: PCT/GB2007/002474 20070703
- 国际公布: WO2008/003948 EN 20080110
- 进入国家日期: 2008-12-31
- 主分类号: G01N3/04
- IPC分类号: G01N3/04
A tensile testing machine has a jaw which comprises a unitary 'H' section member having a cross piece (25) and two uprights (26). The cross piece is mounted to a cantilever beam which is supported on said test machine and has force measuring elements. A pneumatic actuator (20) applies tensile forces to the first ends of the jaw (23) via strands (22) to urge them apart. When first ends of the uprights are urged apart, their oppositely disposed second ends are urged together to grip a sample deposit (29) to be pulled off a substrate in a tensile test. In use, the jaws can be moved at speed, in the order of 500 mm/s to pull the deposit off of the substrate. The force required to pull the deposit off the substrate in this tensile test is measured by the force measuring elements on the beam (35).
公开/授权文献:
- CN101484788A 用于测试电子基底上的沉淀物的拉伸测试装置和方法 公开/授权日:2009-07-15