![利用小的钝化层开口的倒装互连](/CN/2007/8/4/images/200780023871.jpg)
基本信息:
- 专利标题: 利用小的钝化层开口的倒装互连
- 专利标题(英):Flip-chip interconnection with a small passivation layer opening
- 申请号:CN200780023871.3 申请日:2007-06-20
- 公开(公告)号:CN101479845A 公开(公告)日:2009-07-08
- 发明人: W·苏多尔
- 申请人: 皇家飞利浦电子股份有限公司
- 申请人地址: 荷兰艾恩德霍芬
- 专利权人: 皇家飞利浦电子股份有限公司
- 当前专利权人: 皇家飞利浦电子股份有限公司
- 当前专利权人地址: 荷兰艾恩德霍芬
- 代理机构: 永新专利商标代理有限公司
- 代理人: 陈松涛
- 优先权: 60/805,764 2006.06.26 US
- 国际申请: PCT/IB2007/052389 2007.06.20
- 国际公布: WO2008/001282 EN 2008.01.03
- 进入国家日期: 2008-12-25
- 主分类号: H01L23/485
- IPC分类号: H01L23/485 ; A61B8/12
A flip-chip electrical coupling (100, 200, 300) is formed between first and second electrical components (110, 180; 410, 480). The coupling (100, 200, 300) includes a bump (240, 340) and a contact pad (315). The first electrical component (110, 210, 310, 410) includes the contact pad (315) electrically coupled to the first electrical component (110, 210, 310, 410) and a passivation layer (130, 230, 330) overlying the first electrical component (110, 210, 310, 410) and the contact pad (315). The passivation layer (130, 230, 330) is arranged having an opening (120, 220, 320) positioned over the contact pad (315). A bump (240, 340) is positioned overlying the opening (120, 220, 320) and substantially overlying the passivation layer (130, 230, 330). The bump (240, 340) is formed to be in electrical contact with the contact pad (315). The bump (240, 340) is arranged to couple the first and second electrical components (110, 180; 410, 480) during the flip-chip coupling process.
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L23/00 | 半导体或其他固态器件的零部件 |
--------H01L23/34 | .冷却装置;加热装置;通风装置或温度补偿装置 |
----------H01L23/482 | ..由不可拆卸地施加到半导体本体上的内引线组成的 |
------------H01L23/485 | ...包括导电层和绝缘层组成的层状结构,例如平面型触头 |